Monday - Tuesday, September 17-18, 2012 (8:30 am. - 5:00 pm.)
Brookhaven National Laboratory, National Synchrotron Light Source (NSLS), Building 725, Seminar Room
Analytical resources that couple high spatial and spectral resolution are needed to advance the understanding of complex natural and engineered systems that are heterogeneous on the micro- to nanometer scale. These next-generation instruments will allow for characterization of elemental abundances as well as chemical speciation at sub-micrometer resolutions with high sensitivity. While micro- and nanoprobe instruments can be found at many synchrotron radiation facilities worldwide, the very low emittance of the new National Synchrotron Light Source II, now under construction at Brookhaven National Laboratory, will enable x-ray sources for imaging and spectroscopy experiments aspiring to the highest resolutions. At the planned submicrometer resolution x-ray spectroscopy (SRX) beamline, high-speed fluorescence imaging using the Maia detector, fluorescence and absorption spectroscopy, tomography, and microdiffraction will be available to characterize a diverse suite of chemically heterogeneous samples.
This workshop will bring together experts to identify important scientific topics that SRX can impact, to identify synergies across different research areas when using the same instrumentation, and to explore collaborative approaches to addressing research topics successfully.
Research areas to be addressed in the workshop:
- X-ray spectromicroscopy instrumentation – present and future
- Biological sciences
- Energy research
- Environmental sciences
- Materials science
- Planetary sciences
You must have an active BNL ID number to access BNL for the workshop. If you do not have an active BNL ID, you can request one by registering the BNL Guest Information System (GIS): http://www.bnl.gov/guv/gis.asp.